Nvis 6105 Band Gap Measurement (Four Probe Method)
Nvis 6105 Band Gap Measurement (Four Probe Method)
Nvis 6105 Band Gap Measurement (Four Probe Method)
Nvis 6105 Band Gap Measurement (Four Probe Method)

Nvis 6105 Band Gap Measurement (Four Probe Method)

Reference: Nvis6105 - Manufacturer: NVIS TECHNOLOGIES

Determination of Resistivity and Band Gap of Semiconductors by Four Probe Method at different temperatures.

Nvis 6105, Band Gap Measurement (Four Probe Method) is an ideal platform to enhance education, training, skills & development amongs our young minds.

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Nvis 6105 Band Gap Measurement (Four Probe Method)

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Nvis 6105 Resistivity and Band Gap Measurement of semiconductor is a versatile and useful system for physics and basic electronics laboratories. In Nvis 6105, Band Gap can be measured by using Four Probe Method. This is one of the widely used methods for measuring the Resistivity and Band Gap of semiconductors. A collinear four-probe arrangement has been used. In this system, we provide the pressure contacts with sample to take quick measurement on different positions. The setup is equipped with microcontroller based display for simultaneous measurement of voltage, current and temperature. Computer interfacing helps in automatic calculations and analysis.

Nvis 6105, Band Gap Measurement (Four Probe Method) is an ideal platform to enhance education, training, skills & development amongs our young minds.

  • A complete setup for measuring the Resistivity and Band Gap
  • Four individually spring loaded probe arrangement is provided
  • Collinear and equally spaced probes
  • LCD Display
  • The probes are mounted in a Teflon bush, which ensure a good electrical insulation between the probes
  • PC Interfacing using USB/RS232 ports and supporting software is provided
  • Sample-Germanium crystal
  • Online product tutorial
With Display
LCD 16 x 2 characters
Communications
USB/RS232 ports and supporting
software is provided
Category
Analog and Digital Electronics

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