Spectrometer SM-9000
Spectrometer SM-9000
Spectrometer SM-9000
Spectrometer SM-9000
Spectrometer SM-9000
Spectrometer SM-9000

Spectrometer SM-9000

Reference: SM-9000 - Manufacturer: PSI

The SM-9000 spectrometer is used for high-resolution, high-sensitivity measurements in fiber optic spectroscopy applications. Covers UV / VIS or NIR spectral range. The SM 9000 can be used as a standalone instrument or as an optional upgrade to other PSI instruments for precise analysis of spectral curves (in irradiance, absorption, emission mode).

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Spectrometer SM-9000

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The very high sensitivity and thermal stability of the instrument allows single cell fluorescence emission spectra to be measured when combined with our µ-FluorCam device. Spectra can be measured in the range of UV (200 nm) to NIR (980 nm) with a resolution of 3.5 nm (FWHM). Fast recording can capture up to 300 spectra per second (external trigger input) with 16-bit data resolution.

Measured parameters
Transmittance
Absorbance
Irradiance
Fluorescence spectra

Software
Online data presentation as transmittance / absorbance / range graphs
Acquisition of reference signals
External trigger / button click acquisition control
Color and intensity control of the LED light source

Applications
Accurate measurements of irradiance spectra
Fluorescence Emission Spectra Measurements
Spectrally resolved fluorescence induction

Optical input:
diameter 0.5 NA = 0.22 mounted on SMA coupling, removable
Inlet slit:
70 × 1400 µm (optical input)

Rack:
Flat field correction

Spectral range:
200 - 980 nm

Absolute wavelength accuracy:
<0.5 nm

Reproducibility:
<0.1 nm

Temperature induced drift:
<0.01 nm / K

Pixel spectral distance:
Δλ pixel ≈ 0.8 nm

FWHM (Maximum Half Full Width):
Δλ <3-4 nm (UV-NIR version)

Stray light:
0.1% measured at 340 nm with deuterium lamp (transmission of NaNO2 solution, 50 g / l, 1 cm)

CCD matrix:
Hamamatsu S 7031 thermoelectrically cooled

Number of pixels:
1,044 × 64

Pixel Dimensions:
24 × 24 mm2

System data:
16-bit A / D conversion

Noise:
2-4 standard deviation of count

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